SMALL SPOT ED-XRF SPECTROMETER
Many elemental analysis tasks in industry, research, and the sciences
require a nondestructive system that’s extremely sensitive and capable of focused small-spot measurement. The SPECTRO MIDEX XRF spectrometer meets and exceeds these requirements. It offers fast, nondestructive elemental analysis of small spots, plus rapid mapping of large surfaces, including doubleformat printed circuit boards (PCBs). For years, SPECTRO MIDEX has turned in top-rated XRF performance. Recently optimized, the improved SPECTRO MIDEX analyzer sets new standards for analytical performance. Ideal applications include compliance screening for RoHS and similar regulatory directives; the analysis of small components plus detection of inclusions in the metal, automotive, and aerospace industries; elemental analysis in forensics science; and many similar missioncritical tasks.
Accuracy of elemental analysis is often critical — especially in refining precious metals. Remelted samples from reclaimed/recycled alloys may contain other elements besides the expected gold, silver, or platinum.
Refiners must detect and precisely analyze even minor or trace amounts to assess true composition and value. Other users may prioritize speed. High-volume hallmarking centers demand both fast and accurate analysis.
In addition, all users prefer analyzers that are easy to operate, with helpful software and easy transfer of results into a lab network. In dealing with precious metals, of course, users also prize nondestructive
sampling. Finally, ED-XRF analysis particularly can alert users to digestion-resistant alloys such as platinum/iridium mixtures.
For years, SPECTRO MIDEX has turned in top-rated XRF performance in all these areas. Many assay laboratories worldwide subject every sample to SPECTRO MIDEX testing before further processing. Now a new generation of SPECTRO MIDEX analyzers approaches fire assay analysis in precision, and greatly surpasses it in speed and ease.